Standard Operational Procedures for the Gaertner Ellispometer L117 |

| A1 | = | 1st analyzer drum reading (always in the red 0° to 90° markings) |
| A2 | = | 2nd analyzer drum reading, i.e. 180° - A1 |
| P1 | = | 1st polarizer drum reading (always in the red 315° to 135° markings) |
| P2 | = | 2nd polarizer drum reading, i.e. 90° + P1 |
| nf | = | Refractive index of film being measured |
| d | = | Thickness of film being measured |
| ω | = | Thickness period used for determining thicker films |
| φ | = | Angle of incidence selectable by positive pins at 70°, 50° or 30° |
| ns | = | Refractive index of substrate carrying film |
| λ | = | Wavelength of incident light fixed at 6328Å by using a HeNe laser |
| ψ | = | PSI-Amplitude ratio calculated using analyzer readings |
| Δ | = | DEL-Phase difference calculated using polarizer readings |


|   | Graph 1 |   | Graph 2 |   | Graph 3 | |
| Gives Film Thickness (d) of: |   | 400Å to 1120Å |   | 920Å to 1320Å |   | 400Å to 1320Å |
| Film Index (nf) of: |   | 1.3 to 1.5 |   | 1.35 to 1.55 |   | 1.5 to 2.3 |
| P1 + P2 value of: |   | 250° to 285° |   | 250° to 320° |   | 260° to 100° |
| A2 - A1 value of: |   | 60° to 150° |   | 0° to 120° |   | 10° to 150° |
| ψ value of: |   | 15° to 60° |   | 30° to 90° |   | 15° to 85° |
| and Δ value of: |   | 75° to 110° |   | 40° to 110° |   | 260° to 100° |


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Updated September 9, 2003 Created by Jonas Webster email: jonas.webster@utah.edu Microfabrication Laboratory |